Enhanced fast device calibration across level and frequency simultaneously
Discontinuous timeslot TXP – supports simultaneous power measurement for up to 7 timeslots, reduces phone calibration time
Fast device tune (FDT) – faster simultaneous mobile phone Rx and Tx calibration (based on typical test plan) Phase and amplitude versus time (PAvT) – measurement for calibration of polar modulated devices Dynamic power – fast automatic signaling and non-signaling method for Tx output power calibration Some licensed feature options can also be used in R&D and reduce your R&D cycle fast The E1968A includes all essential connection types and signaling options necessary for a complete GSM/GPRS/ EGPRS/E-EDGE manufacturing test solution Accelerate production of high volume quality phones at the lowest possible cost
